REVERSED
Tech Center 1700 Chemical & Materials Engineering
1793 Ex Parte Ruijter 14396649 - (D) OWENS Dissenting REN 103 NIXON & VANDERHYE, PC GEORGE,PATRICIAANN
Tech Center 2800 Semiconductors, Electrical and Optical Systems and Components
2812 Ex Parte SUNDAHL et al 15198235 - (D) CASHION 102 CYPRESS SEMICONDUCTOR CORPORATION TRAN, ANDREW Q
Tech Center 3600 Transportation, Construction, Electronic Commerce, Agriculture, National Security, and License & Review
3646 Ex Parte THINGULDSTAD et al 13289301 - (D) PLENZLER 103 Ryan Alley IP (GE Docket) DAVIS, SHARON M
Tech Center 3700 Mechanical Engineering, Manufacturing, and Products & Design
3752 Ex Parte FRANSON et al 14303133 - (D) LORIN 102 HARNESS, DICKEY & PIERCE, P.L.C. CERNOCH, STEVEN MICHAEL
3761 Ex Parte Sun 12413350 - (D) HOSKINS 102/103 ELECTRO SCIENTIFIC INDUSTRIES, INC. DUNNER, DIALLO IGWE
3774 Ex Parte Clifford et al 13800676 - (D) GUIJT 103 Moximed, Inc PRONE, CHRISTOPHER D
3791 Ex Parte Fitzgerald et al 13509035 - (D) FREDMAN 112(2)/103/OTDP Covidien LP KREMER, MATTHEW
However, in determining pertinent art, [t]he question is not whether simple concepts ... are within the knowledge of lay people or even within the knowledge of a person of ordinary skill in the art. Rather, the question is whether an inventor would look to this particular art to solve the particular problem at hand.
Circuit Check Inc. v. QXQ Inc., 795 F.3d 1331, 1335 (Fed. Cir. 2015).
3791 Ex Parte Lücke et al 13120592 - (D) CALVE 102/103 BUCHANAN, INGERSOLL & ROONEY PC ABOUELELA, MAY A
3791 Ex Parte Kobayashi et al 14557806 - (D) MAJORS 103 PEARNE & GORDON LLP WINAKUR, ERIC FRANK
3792 Ex Parte Curran et al 15208436 - (D) CALVE 102 Wiley Rein LLP MORALES, JON ERIC C
AFFIRMED-IN-PART
Tech Center 2800 Semiconductors, Electrical and Optical Systems and Components
2856 Ex Parte Chien 13523101 - (D) ROBERTSON 112(1)/112(2)/103 112(1)/112(2)/103 WOLF GREENFIELD & SACKS, P.C. ZHONG, XIN Y
AFFIRMED
Tech Center 1700 Chemical & Materials Engineering
1733 Ex Parte FENG et al 14193198 - (D) NAGUMO concurring RANGE and REN 103 McNeesWallace&NurickLLC WU, JENNY R
1762 Ex Parte Schümann et al 14640835 - (D) INGLESE 103 Norris McLaughlin, PA NGUYEN, VU ANH
1791 Ex Parte Townsend et al 11418457 - (D) OWENS 112(1)/112(2) 103 FITCH EVEN TABIN & FLANNERY, LLP BEKKER, KELLY JO
1791 Ex Parte Anderson et al 12875521 - (D) COLAIANNI 103 FITCH EVEN TABIN & FLANNERY, LLP STIJLII, VERA
1793 Ex Parte Döring et al 15196748 - (D) COLAIANNI 103 DILWORTH & BARRESE, LLP MORNHINWEG, JEFFREY P
Tech Center 2400 Networking, Multiplexing, Cable, and Security
2425 Ex Parte Le Pelerin et al 14128166 - (D) DESHPANDE 103 OBLON/KUDELSKI ALCON, FERNANDO
Tech Center 2800 Semiconductors, Electrical and Optical Systems and Components
2829 Ex Parte Kautzsch et al 15064916 - (D) DENNETT 103 Eschweiler & Potashnik, LLC. TRAN, DZUNG
Tech Center 3600 Transportation, Construction, Electronic Commerce, Agriculture, National Security, and License & Review
3669 Ex Parte Long 14861317 - (D) CAPP 112(2)/103 MAIER & MAIER, PLLC WORDEN, THOMAS E
3674 Ex Parte Patil et al 14636964 - (D) JESCHKE 103 Baker Botts L.L.P. RUNYAN, SILVANAC
Tech Center 3700 Mechanical Engineering, Manufacturing, and Products & Design
3741 Ex Parte Ivory et al 13725138 - (D) KERINS 112(1)/102/103 103 O""Shea Getz P.C. DUGER, JASON H
3771 Ex Parte McNeela et al 14096083 - (D) LAVIER 102/103 ALCON DAVID, SHAUN L
REEXAMINATION
REVERSED
Tech Center 3700 Mechanical Engineering, Manufacturing, and Products & Design
3731 Ex parte JONATHAN BERALL Appellant, Patent Owner Ex Parte 5,827,178 et al 08/778,079 90011383 - (D) McCARTHY 103 Jonathan Berall; For the Requester in Ex parte Reexamination 90/012,340: KATSUHIRO YOSHINO HOYA SERVICE CORPORATION For the Requester in Ex parte Reexamination 90/011,383: OBLON, SPIVAK, MCCLELLAND MAIER & NEUSTADT, LLP WEHNER, CARY ELLEN original TRUONG, KEVIN THAO
