REVERSED
Tech Center 1600 Biotechnology and Organic Chemistry
1631 Ex Parte Downey et al 12565839 - (D) GRIMES 112(1)/102/103 MENDELSOHN DUNLEAVY, P.C. NEGIN, RUSSELL SCOTT
Tech Center 1700 Chemical & Materials Engineering
1763 Ex Parte Kido et al 13392330 - (D) BEST 103 WESTERMAN, HATTORI, DANIELS & ADRIAN, LLP CAI, WENWEN
Tech Center 2100 Computer Architecture and Software
2184 Ex Parte MANNARSWAMY et al 12642544 - (D) PINKERTON 103 Hewlett Packard Enterprise BARTELS, CHRISTOPHER A.
Tech Center 2400 Networking, Multiplexing, Cable, and Security
2447 Ex Parte Knox et al 13172919 - (D) STRAUSS 103 YEE AND ASSOCIATES, P.C JOSHI, SURAJM
Tech Center 3700 Mechanical Engineering, Manufacturing, and Products & Design
3731 Ex Parte Shadeck et al 13799233 - (D) SCHOPFER 103 DICKE, BILLIG & CZAJA, PLLC MDT SURGICAL TECHNOLOGIES MATTERS DANG, ANH TIEU
AFFIRMED-IN-PART
Tech Center 2400 Networking, Multiplexing, Cable, and Security
2413 Ex Parte G. Santos et al 13599803 - (D) YAP 103 103 Hewlett Packard Enterprise LOU, PEIAN
AFFIRMED
Tech Center 1600 Biotechnology and Organic Chemistry
1624 Ex Parte Singh et al 12487486 - (D) SMITH double patenting McDonnell Boehnen Hulbert & Berghoff LLP BALASUBRAMANIAN, VENKATARAMAN
An obviousness-type double patenting analysis is generally analogous to an obviousness analysis under 35 U.S.C. § 103. See, e.g., Abbvie Inc. v. Mathilda and Terence Kennedy Institute of Rheumatology Trust, 764 F.3d 1366, 1378—79 (Fed. Cir. 2014) (citing cases).
1637 Ex Parte Laitala et al 11252851 - (D) COTTA 103 BUCHANAN, INGERSOLL & ROONEY PC CHUNDURU, SURYAPRABHA
Tech Center 1700 Chemical & Materials Engineering
1766 Ex Parte IIJIMA et al 14287492 - (D) ROSS 101 103 FLYNN THIEL BOUTELL & TANIS, P.C. DOLLINGER, MICHAEL M
1777 Ex Parte Lim et al 13121006 - (D) McGEE 103 JWIP & Patent Services, LLC MENON, KRISHNAN S
Tech Center 3600 Transportation, Construction, Electronic Commerce, Agriculture, National Security, and License & Review
3681 Ex Parte Blom 13099978 - (D) FETTING 112(2) 101/102 Ditthavong & Steiner, P.C. REFAI, SAM M
