REVERSED

1700 Chemical & Materials Engineering
1741 Ex Parte Dawes et al 10/053,365 NAGUMO 103(a) CORNING INCORPORATED EXAMINER HOFFMANN, JOHN M

2100 Computer Architecture and Software
2116 Ex Parte Belady et al 11/058,554 DANG 103(a) HEWLETT-PACKARD COMPANY EXAMINER REHMAN, MOHAMMED H

2800 Semiconductors, Electrical and Optical Systems and Components
2816 Ex Parte Afghahi et al 10/795,825 MANTIS MERCADER 102(b) MCANDREWS HELD & MALLOY, LTD EXAMINER WELLS, KENNETH B

AFFIRMED-IN-PART

2100 Computer Architecture and Software
2113 Ex Parte Wagner et al 10/517,471 JEFFERY 102(b)/103(a) NXP, B.V. NXP INTELLECTUAL PROPERTY & LICENSING EXAMINER BONZO, BRYCE P
REEXAMINATION

EXAMINER AFFIRMED

3900 Central Reexamination Unit (CRU)
2608 Ex parte RONALD A. KATZ TECHNOLOGY LICENSING L.P. Appellant 90/008,057 5,351,285 BOALICK 102(b)/103(a) FOR PATENT OWNER: REENA KUYPER, ESQ. BYARD NILSSON, ESQ. FOR THIRD PARTY REQUESTER: JOHN L. WELSH EXAMINER original EXAMINER WOO, STELLA L KIELIN, ERIK J

NEW

REEXAMINATION

06/06/2011 2608 Ex parte RONALD A. KATZ TECHNOLOGY LICENSING L.P. Appellant 90/008,057 5,351,285 BOALICK 102(b)/103(a) FOR PATENT OWNER: REENA KUYPER, ESQ. BYARD NILSSON, ESQ. FOR THIRD PARTY REQUESTER: JOHN L. WELSH WELSH & FLAXMAN LLC EXAMINER KIELIN, ERIK J original EXAMINER WOO, STELLA L

AFFIRMED

1744 Ex Parte Sreenivasan et al 10/923,629 HASTINGS 103(a) MOLECULAR IMPRINTS EXAMINER LUK, EMMANUEL S

DISMISSED

2433 Ex Parte Simske et al 11/467,539 SHAW RCE HEWLETT-PACKARD COMPANY EXAMINER WOLDEMARIAM, NEGA

2445 Ex Parte Solt 11/353,548 SHAW RCE HEWLETT-PACKARD COMPANY EXAMINER LEE, BRYAN Y

3623 Ex Parte Shen et al 10/046,226 SHAW JAMES M. STOVER TERADATA CORPORATION EXAMINER BOSWELL, BETH V